海量图书期刊资源,随时随地畅享阅读乐趣
[IEEE 2008 IEEE Custom Integrated Circuits Conference - San Jose, CA, USA (2008.09.21-2008.09.24)] 2008 IEEE Custom Integrated Circuits Conference - Proceedings of the IEEE 2008 custom integrated circuits conference2008
[IEEE IEEE 2005 Custom Integrated Circuits Conference, 2005. - San Jose, CA, USA (Sept. 18-21, 2005)] Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005. - Custom circuitsKawa, J.; Snyder, J. · 2005
[IEEE 2007 IEEE Custom Integrated Circuits Conference - San Jose, CA, USA (2007.09.16-2007.09.19)] 2007 IEEE Custom Integrated Circuits Conference - Covers2007
[IEEE IEEE Custom Integrated Circuits Conference 2006 - San Jose, CA, USA (2006.09.10-2006.09.13)] IEEE Custom Integrated Circuits Conference 2006 - Verification of Complex Analog Integrated CircuitsKundert, Ken; Chang, Henry · 2006
[IEEE IEEE Custom Integrated Circuits Conference 2006 - San Jose, CA, USA (2006.09.10-2006.09.13)] IEEE Custom Integrated Circuits Conference 2006 - Paper Withdrawn2006
[IEEE IEEE Custom Integrated Circuits Conference 2006 - San Jose, CA, USA (2006.09.10-2006.09.13)] IEEE Custom Integrated Circuits Conference 2006 - Author Index2006
[IEEE 2007 IEEE Custom Integrated Circuits Conference - San Jose, CA, USA (2007.09.16-2007.09.19)] 2007 IEEE Custom Integrated Circuits Conference - Author Index2007
[IEEE 2008 IEEE Custom Integrated Circuits Conference - CICC 2008 - San Jose, CA, USA (2008.09.21-2008.09.24)] 2008 IEEE Custom Integrated Circuits Conference -Wens, Mike; Steyaert, Michiel · 2008
A 12-bit intrinsic accuracy high-speed CMOS DACBastos, J.; Marques, A.M.; Steyaert, M.S.J.; Sansen, W. · 1998
[IEEE International Conference on Microelectronic Test Structures - Nara, Japan (22-25 March 1995)] Proceedings International Conference on Microelectronic Test Structures - Statistics for matchingPergoot, A.; Graindourze, B.; Janssens, E.; Bastos, J.; Steyaert, M.; Kinget, P.; Roovers, R.; Sansen, W. · 1995
[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - Matching of MOS transistors with different layout stylesBastos, J.; Steyaert, M.; Graindourze, B.; Sansen, W. · 1996
[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - Influence of die attachment on MOS transistor matchingBastos, J.; Steyaert, M.; Graindourze, B.; Sansen, W. · 1996
[IEEE CICC 97 - Custom Integrated Circuits Conference - Santa Clara, CA, USA (5-8 May 1997)] Proceedings of CICC 97 - Custom Integrated Circuits Conference - Custom analog low power design: the problem of low voltage and mismatchSteyaert, M.; Peluso, V.; Bastos, J.; Kinget, P.; Sansen, W. · 1997
[IEEE IEEE 1998 Custom Integrated Circuits Conference - Santa Clara, CA, USA (11-14 May 1998)] Proceedings of the IEEE 1998 Custom Integrated Circuits Conference (Cat. No.98CH36143) - A 12 bit 200 MHz low glitch CMOS D/A converterVan den Bosch, A.; Borremans, M.; Vandenbussche, J.; Van der Plas, G.; Marques, A.; Bastos, J.; Steyaert, M.; Gielen, G.; Sansen, W. · 1998
[IEEE 1998 IEEE International Solid-State Circuits Conference. Digest of Technical Papers. ISSCC - San Francisco, CA, USA (5-7 Feb. 1998)] 1998 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, ISSCC. First Edition (Cat. No.98CH36156) - A 12 b accuracy 300 Msample/s update rate CMOS DACMarques, A.; Bastos, J.; Van den Bosch, A.; Vandenbussche, J.; Steyaert, M.; Sansen, W. · 1998