![SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida (Monday 5 April 2010)] Radar Sensor Technology XIV - <title>The Rayleigh problem is everywhere!</title>]()
SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida (Monday 5 April 2010)] Radar Sensor Technology XIV - <title>The Rayleigh problem is everywhere!</title>Gray, John E.; Addison, Stephen R.; Ranney, Kenneth I.; Doerry, Armin W. · 2010