![[IEEE 2019 IEEE 26th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Hangzhou, China (2019.7.2-2019.7.5)] 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) - Practical Dynamic Laser Stimulation Technique and Code Modification: A Soft Defect Localization Approach for Microcontroller Self-Test Failures]()
[IEEE 2019 IEEE 26th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Hangzhou, China (2019.7.2-2019.7.5)] 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) - Practical Dynamic Laser Stimulation Technique and Code Modification: A Soft Defect Localization Approach for Microcontroller Self-Test FailuresCala, Kevin Joshua S.; Saludares, Junald C.; Basbas, Wendel A. · 2019