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Novel Photovoltaic Micro Crack Detection TechniqueDhimish, Mahmoud; Holmes, Violeta; Mather, Peter · IEEE Transactions on Device and Materials Reliability · 2019
Preliminary assessment of the solar resource in the United KingdomDhimish, Mahmoud; Holmes, Violeta; Mather, Peter; Sibley, Martin · Clean Energy · 2018
Ultra-Fast High-Resolution Solar Cell Cracks Detection ProcessDhimish, Mahmoud; Mather, Peter · IEEE Transactions on Industrial Informatics · 2019
Output Power Enhancement for Hot Spotted Polycrystalline Photovoltaic Solar CellsDhimish, Mahmoud; Holmes, Violeta; Mehrdadi, Bruce; Dales, Mark; Mather, Peter · IEEE Transactions on Device and Materials Reliability · 2017
Evaluating Power Loss and Performance Ratio of Hot-Spotted Photovoltaic ModulesDhimish, Mahmoud; Mather, Peter; Holmes, Violeta · IEEE Transactions on Electron Devices · 2018
Development of 3D graph-based model to examine photovoltaic micro cracksDhimish, Mahmoud; Holmes, Violeta; Mather, Peter; Aissa, Chouder; Sibley, Martin · Journal of Science: Advanced Materials and Devices · 2018
Photovoltaic fault detection algorithm based on theoretical curves modelling and fuzzy classification systemDhimish, Mahmoud; Holmes, Violeta; Mehrdadi, Bruce; Dales, Mark; Mather, Peter · Energy · 2017
Spin coating over topographyPeurrung, L.M.; Graves, D.B. · IEEE Transactions on Semiconductor Manufacturing · 1993
2014 VLSI Technology SymposuimIEEE Transactions on Semiconductor Manufacturing · 2014
Leading the field since 1884IEEE Transactions on Semiconductor Manufacturing · 2013
Supplier improvement via SPC applications workshopsAckermann, C.S. · IEEE Transactions on Semiconductor Manufacturing · 1993
Specular spectroscopic scatterometryXinhui Niu, ; Jakatdar, N.; Junwei Bao, ; Spanos, C.J. · IEEE Transactions on Semiconductor Manufacturing · 2001
A Continuous Murphy's IntegralNadarajah, S. · IEEE Transactions on Semiconductor Manufacturing · 2009
Defect size distribution in VLSI chipsGlang, R. · IEEE Transactions on Semiconductor Manufacturing · 1991
A new gas circulation RIEOhiwa, T.; Sakai, I.; Okumura, K. · IEEE Transactions on Semiconductor Manufacturing · 2000