Radiation Effects of Proton Particles in Memory DevicesLho, Young Hwan; Kim, Ki Yup · ETRI Journal · 2007

SPIE Proceedings [SPIE ICMIT 2005: Merchatronics, MEMS, and Smart Materials - Chongqing, China (Tuesday 20 September 2005)] ICMIT 2005: Mechatronics, MEMS, and Smart Materials - <title>The board implementation of AVR microcontroller checking for single event upsets</title>Lho, Young Hwan; Jang, Dae Jin; Seo, Kang Kuk; Jung, Jae Ho; Kim, Ki Yup; Wei, Yunlong; Chong, Kil To; Takahashi, Takayuki; Liu, Shengping; Li, Zushu; Jiang, Zhongwei; Choi, Jin Young · 2005

[IEEE 30th Annual Conference of IEEE Industrial Electronics Society, 2004. IECON 2004 - Busan, South Korea (2-6 Nov. 2004)] 30th Annual Conference of IEEE Industrial Electronics Society, 2004. IECON 2004 - A v effect on the power MOSFETYoung Hwan Lho, ; Ki Yup Kim, · 2004

[IEEE 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. - Beijing, China (Oct. 18-21, 2004)] Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. - The board implementation for checking SEU test on memory devicesYoung Hwan Lho, ; Ki Yup Kim, · 2004

Provably Secure Aggregate Signcryption SchemeRen, Xun-Yi · ETRI Journal · 2012

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Complex Quadrature Spatial ModulationMohaisen, Manar; Lee, Saetbyeol · ETRI Journal · 2017

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CorrigendumETRI Journal · 2018

Hybrid Facial Representations for Emotion RecognitionYun, Woo-han · ETRI Journal · 2013

A Low-Delay MDCT/IMDCTLee, Sangkil · ETRI Journal · 2013

Guest EditorialNam, Eun Soo · ETRI Journal · 2013