[IEEE IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - Philadelphia, PA, USA (25-28 Sept. 1989)] IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - System engineering considerations and methodology for effecting a cohesive functional/parametric testing strategy
- 作者Granieri, M.N.
- 文件大小545.74KB
- 发表时间1989
- DOI10.1109/autest.1989.81091
- 页码1-8
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