![[IEEE 2006 IEEE International Conference on IC Design and Technology - Padova, Italy ()] 2006 IEEE International Conference on IC Design and Technology - A scalable Stacked Gate NOR/NAND Flash Technology compatible with high-k and metal gates for sub 45nm generations]()
[IEEE 2006 IEEE International Conference on IC Design and Technology - Padova, Italy ()] 2006 IEEE International Conference on IC Design and Technology - A scalable Stacked Gate NOR/NAND Flash Technology compatible with high-k and metal gates for sub 45nm generationsde Vos, J.; Haspeslagh, L.; Demand, M.; Devriendt, K.; Wellekens, D.; Beckx, S.; van Houdt, J. · 2006