About the Reliability of Approximate Methods for Analysing Photoreflectance Spectra of Semiconductors
- 作者Dr. H. Neumann; Kh. Bouamama
- 卷第27卷
- 期第6期
- 印刷ISSN0232-1300
- 电子ISSN1521-4079
- 文件大小592.69KB
- 发表时间1992
- DOI10.1002/crat.2170270621
- 页码851-861
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About the Reliability of Approximate Methods for Analysing Photoreflectance Spectra of SemiconductorsDr. H. Neumann; Kh. Bouamama · 1992