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- 期刊名称Microscopy Today
- 期第7期
- 印刷ISSN1551-9295
- 电子ISSN2150-3583
- 文件大小371.02KB
- 发表时间1992-09
- DOI10.1017/S1551929500050720
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching || Atomic Force Microscopy, · 2006
Atomic Force Microscopy/Scanning Tunneling Microscopy 3 || Atomic Force Microscopy of OlivineCohen, Samuel H.; Lightbody, Marcia L. · 2002
Atomic Force Microscopy/Scanning Tunneling Microscopy 3 || A Force Limitation for Successful Observation of Atomic Defects: Defect Trappong of the Atomic Force Microscopy TipCohen, Samuel H.; Lightbody, Marcia L. · 2002
Atomic Force Microscopy Volume 242 || Imaging Methods in Atomic Force MicroscopyBraga, Pier Carlo; Ricci, Davide · 2003
Atomic Force Microscopy Volume 242 || Atomic Force Microscopy of Protein ComplexesBraga, Pier Carlo; Ricci, Davide · 2003
[NanoScience and Technology] Atomic Force Microscopy || Noise in Atomic Force MicroscopyVoigtländer, Bert · 2019
Atomic Force Microscopy in Nanobiology || Studying the Cytoskeleton by Atomic Force MicroscopyTakeyasu, Kunio · 2014
Atomic Force Microscopy Volume 242 || Corneal Tissue Observed by Atomic Force MicroscopyBraga, Pier Carlo; Ricci, Davide · 2003
Product NewsMicroscopy Today · 2014
CalendarWebster, Paul · Microscopy Today · 2010
DIATOME U.S.Microscopy Today · 2011
Quartz ImagingMicroscopy Today · 2011
Microscopy Today Innovation AwardsLyman, Charles · Microscopy Today · 2012
Product NewsMicroscopy Today · 2012
Hitachi High Technologies America, Inc.Microscopy Today · 2013
CalendarWebster, Paul · Microscopy Today · 2013