[IEEE LEOS '93 - San Jose, CA, USA (15-18 Nov. 1993)] Proceedings of LEOS '93 - Photocurrent and electroreflectance measurements of MOVPE grown InGaP/InAlGaP multiple quantum wells for optoelectronic applications in the visible wavelength range
- 作者Blum, O.; Fritz, I.J.; Schneider, R.P.; Howard, A.J.
- 文件大小171.98KB
- 发表时间1993
- DOI10.1109/leos.1993.379254
- 页码450-451
[IEEE 1995 Proceedings. 45th Electronic Components and Technology Conference - Las Vegas, NV, USA (1995.05.21-1995.05.24)] 1995 Proceedings 45th Electronic Components and Technology Conference ECTC-95 - 1995 Proceedings. 45th Electronic Components and Technology Conference1995
[IEEE 1995 Proceedings. 45th Electronic Components and Technology Conference - Las Vegas, NV, USA (1995.05.21-1995.05.24)] 1995 Proceedings 45th Electronic Components and Technology Conference ECTC-95 - Author index1995
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[IEEE 1995 Proceedings. 45th Electronic Components and Technology Conference - Las Vegas, NV, USA (21-24 May 1995)] 1995 Proceedings. 45th Electronic Components and Technology Conference - Flat panel display packagingTurner, W.; Lin, G. · 1995
[IEEE 1995 Proceedings. 45th Electronic Components and Technology Conference - Las Vegas, NV, USA (21-24 May 1995)] 1995 Proceedings. 45th Electronic Components and Technology Conference - Crack initiation and growth in electronic packagesIleri, L.; Madenci, E. · 1995
[IEEE 1995 Proceedings. 45th Electronic Components and Technology Conference - Las Vegas, NV, USA (21-24 May 1995)] 1995 Proceedings. 45th Electronic Components and Technology Conference - High ohmic value resistive inksMoroz, M. · 1995
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