The optimistic update theorem for path delay testing in sequential circuits
- 作者Soumitra Bose; Prathima Agrawal; Vishwani D. Agrawal
- 卷第4卷
- 期第3期
- 印刷ISSN0923-8174
- 电子ISSN1573-0727
- 文件大小501.36KB
- 发表时间1993-08
- DOI10.1007/bf00971977
- 页码285-290
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