![SPIE Proceedings [SPIE Semiconductors '92 - Somerset, NJ (Sunday 22 March 1992)] Spectroscopic Characterization Techniques for Semiconductor Technology IV - <title>Systematic optical study of In<formula><inf><roman>x</roman></inf></formula>Ga<formula><inf><roman>1-x</roman></inf></formula>As on InP using photoluminescence, photoreflectance, and micro-Raman spectroscopy</title>]()
SPIE Proceedings [SPIE Semiconductors '92 - Somerset, NJ (Sunday 22 March 1992)] Spectroscopic Characterization Techniques for Semiconductor Technology IV - <title>Systematic optical study of In<formula><inf><roman>x</roman></inf></formula>Ga<formula><inf><roman>1-x</roman></inf></formula>As on InP using photoluminescence, photoreflectance, and micro-Raman spectroscopy</title>Estrera, Joseph P.; Duncan, Walter M.; Kao, Yung C.; Liu, H. Y.; Stevens, Patrick D.; Beam III, E. A.; Glembocki, Orest J. · 1992