Quantitative X-Ray Microanalysis for the Study of Nanometer-Scale Phases in the Aem
- 期刊名称MRS Proceedings
- 作者Anderson, Ian M.; Bentley, Jim; Carter, C. Barry
- 卷第332卷
- 电子ISSN1946-4274
- 文件大小983.20KB
- 发表时间1994-1
- DOI10.1557/proc-332-315
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