![[IEEE Comput. Soc. Press IEEE/ACM International Conference on Developing and Managing Expert System Programs - Washington, DC, USA (30 Sept.-2 Oct. 1991)] [1991] Proceedings of the IEEE/ACM International Conference on Developing and Managing Expert System Programs - A comparison of rule-based, k-nearest neighbor, and neural net classifiers for automated industrial inspection]()
[IEEE Comput. Soc. Press IEEE/ACM International Conference on Developing and Managing Expert System Programs - Washington, DC, USA (30 Sept.-2 Oct. 1991)] [1991] Proceedings of the IEEE/ACM International Conference on Developing and Managing Expert System Programs - A comparison of rule-based, k-nearest neighbor, and neural net classifiers for automated industrial inspectionCho, T.-H.; Conners, R.W.; Araman, P.A. · 1991