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[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Reliability testing of GaAs MMICs

[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Reliability testing of GaAs MMICs

Anderson, W.T.; Roussos, J.A.; Christianson, K.A.

作者Anderson, W.T.; Roussos, J.A.; Christianson, K.A.
文件大小242.18KB
发表时间1995
DOI10.1109/IPFA.1995.487616
页码161-163

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