海量图书期刊资源,随时随地畅享阅读乐趣
Abstracts of current literatureM. H. P. Friedman; Helen Battle; Ivan Bennett; Wm. D. Beamer; J. Edward Berk; J. B. Bernstine; G. P. Blundell; F. X. Chockley; H. W. Davenport; S. A. Friedman; Carmella Foderaro; J. L. Garcia Oller; J. Logan Irvin; D. L. Klein; G. Klenner; Edgar D. Knerr; S. A. Komarov; Harry Metzger; J. M. Mcgeehan; M. J. Oppenheimer; Karl E. Paschkis; I. J. Pincus; R. J. Revelli; B. C. Riggs; Frederick H. Scharles; James P. Schooley; H. Siplet; G. W. Stavraky; I. M. Theone; G. A. H. Tice; Adolph A. Walkling; D. A. Wocker; J. Cox; Wm. Snape; I. M. Theone; F. X. Chockley; Wm. Snape; F. X. Chockley; G. Klenner; I. M. Therme; D. A. Wocker; H. N. Metzger; M. H. F. Friedman; N. M. Short; E. R. Feaver; F. E. St. George; D. A. Wocker; R. L. Burdick · 1944
Reduced oxygen stress promotes propagation of murine postnatal enteric neural progenitors in vitroC. Hegewald; R. Alt; S. Hetz; M. Cross; A. Acikgoez; H. Till; R. Metzger; M. Metzger · 2011
Sectional notesM. A. Lindsay; C. H. Metzger; John R. Robertson; W. B. Ward; Verne C. Beverly; E. R. Jackman; John Noonan; H. R. Talmage · 1946
ProblemsC. Raju; R. Shantaram; P. M. Dunson; M. S. Klamkin; H. Klostergaard; R. P. Boas; J. Propp; H. Kestelman; J. Silverman; M. J. Dixon; M. B. Gregory; J. M. Metzger; P. Zwier; E. T. Wong; P. K. Garlick; R. A. Gibbs; S. F. Barger; E. P. Starke; F. Morrison; J. L. Murphy; A. Bager; D. J. Aulicino; R. Razen; E. L. Isaacson · 1979
Seed potato certification notesE. L. Newdick; E. R. Bennett; K. W. Lauer; A. W. Palm; E. R. Jackman; C. H. Metzger; Karl H. Fernow; A. G. Tolaas; E. M Gillig; J. G. Milward · 1930
Sectional notesE. Marx; C. H. Metzger; B. A. Brown; Eugene W. Whitman; H. R. Talmage; Frank W. Hussey; H. A. Reiley; Marx Koehnke; J. C. Campbell; E. V. Hardenburg; Karl H. Fernow; Earl B. Tussing; E. R. Jackman; C. A. Henderson; O. D. Burke; K. W. Lauer; John Noonan; H. L. Bailey; Chas D. Gaines; W. N. Keenan; R. E. Goodin · 1943
Sectional notesM. A. Lindsay; C. H. Metzger; B. A. Brown; Eugene W. Whitman; W. B. Ward; John S. Gardner; A. G. Tolaas; Marx Koehnke; J. C. Campbell; H. R. Talmage; E. V. Hardenburg; C. A. Henderson; H. L. Bailey · 1944
Sectional notesM. A. Lindsay; C. A. Henderson; Chas D. Gaines; C. H. Metzger; B. A. Brown; A. H. Eddins; Eugene W. Whitman; W. B. Ward; John S. Gardner; H. A. Reiley; Marx Koehnke; J. C. Campbell; H. R. Talmage; E. V. Hardenburg; H. H. Zimmerley · 1944
Proximity effect correction for nanolithographyRau, Richard · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1996
Lithography with 157 nm lasersBloomstein, T. M. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1997
X-ray lithographyHeuberger, A. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1988
Resolution limits of optical lithographyOkazaki, Shinji · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1991
Review of scanning force microscopySarid, Dror · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1991
Diamond nanorodsShenderova, O. A.; Padgett, C. W.; Hu, Z.; Brenner, D. W. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 2005
Dielectric/semiconductor interfacesWieder, H. H. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1993
Two-dimensional carrier profilingVandervorst, W. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1992