![SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California (Sunday 22 January 2012)] Image Processing: Algorithms and Systems X; and Parallel Processing for Imaging Applications II - <title>Multi-resolution analysis for region of interest extraction in thermographic nondestructive evaluation</title>]()
SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California (Sunday 22 January 2012)] Image Processing: Algorithms and Systems X; and Parallel Processing for Imaging Applications II - <title>Multi-resolution analysis for region of interest extraction in thermographic nondestructive evaluation</title>Ortiz-Jaramillo, B.; Fandiño Toro, H. A.; Benitez-Restrepo, H. D.; Orjuela-Vargas, S. A.; Castellanos-Domínguez, G.; Philips, W.; Egiazarian, Karen O.; Agaian, Sos S.; Gotchev, Atanas P.; Recker, John; Wang, Guijin · 2012