![[IEEE 2011 IEEE Pulsed Power Conference (PPC) - Chicago, IL, USA (2011.06.19-2011.06.23)] 2011 IEEE Pulsed Power Conference - Test for end connection integrity of metalized film capacitors]()
[IEEE 2011 IEEE Pulsed Power Conference (PPC) - Chicago, IL, USA (2011.06.19-2011.06.23)] 2011 IEEE Pulsed Power Conference - Test for end connection integrity of metalized film capacitorsQin, Shanshan; Qi, Xiaoguang; Jow, Richard; Boggs, Steven · 2011