![SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Thursday 9 October 2014)] Optical Design and Testing VI - Calculation of Mueller matrix for light scattering from randomly rough surface]()
SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Thursday 9 October 2014)] Optical Design and Testing VI - Calculation of Mueller matrix for light scattering from randomly rough surfaceWang, Yongtian; Du, Chunlei; Sasián, José; Tatsuno, Kimio; Yan, Keding; Wang, Shouyu; Jiang, Shu; Xue, Liang; Song, Yuanyuan; Yan, Zhengang; Li, Zhenhua · 2014