![[IEEE 31st Annual Conference of IEEE Industrial Electronics Society, 2005. IECON 2005. - Raleigh, NC, USA (2005.11.6-2005.11.6)] 31st Annual Conference of IEEE Industrial Electronics Society, 2005. IECON 2005. - Implementation of a low-cost real-time virtue test bed for hardware-in-the-loop testing]()
[IEEE 31st Annual Conference of IEEE Industrial Electronics Society, 2005. IECON 2005. - Raleigh, NC, USA (2005.11.6-2005.11.6)] 31st Annual Conference of IEEE Industrial Electronics Society, 2005. IECON 2005. - Implementation of a low-cost real-time virtue test bed for hardware-in-the-loop testingLu, B.; Wu, X.; Monti, A. · 2005