![[IEEE 2013 International conference on Circuits, Controls and Communications (CCUBE) - BENGALURU, India (2013.12.27-2013.12.28)] 2013 International conference on Circuits, Controls and Communications (CCUBE) - Comparison of multiple fin heights for increasing drain current in N-FinFET]()
[IEEE 2013 International conference on Circuits, Controls and Communications (CCUBE) - BENGALURU, India (2013.12.27-2013.12.28)] 2013 International conference on Circuits, Controls and Communications (CCUBE) - Comparison of multiple fin heights for increasing drain current in N-FinFETMishra, Vimal Kumar; Chauhan, R.K. · 2013