![SPIE Proceedings [SPIE Laser-Induced Damage in Optical Materials: 1998 - Boulder, CO (Monday 28 September 1998)] Laser-Induced Damage in Optical Materials: 1998 - <title>National round-robin test on laser induced damage at 1.064 μm: revised data reduction and correlation analysis</title>]()
SPIE Proceedings [SPIE Laser-Induced Damage in Optical Materials: 1998 - Boulder, CO (Monday 28 September 1998)] Laser-Induced Damage in Optical Materials: 1998 - <title>National round-robin test on laser induced damage at 1.064 μm: revised data reduction and correlation analysis</title>Arenberg, Jonathan W.; Riede, Wolfgang; Broulik, Ulrike; Steiger, Bernhard; Willamowski, Uwe; Ristau, Detlev; Exarhos, Gregory J.; Guenther, Arthur H.; Kozlowski, Mark R.; Lewis, Keith L.; Soileau, M. J. · 1999