Prediction of early lethal SEGR failures of VDMOSFETs for commercial space systems'

Titus, J.L.; Wheatley, C.F.; Wheatley, T.H.; Levinson, W.A.; Burton, D.I.; Barth, J.L.; Reed, R.A.; LaBel, K.A.; Howard, J.W.; van Tyne, K.M.

期刊名称IEEE Transactions on Nuclear Science
作者Titus, J.L.; Wheatley, C.F.; Wheatley, T.H.; Levinson, W.A.; Burton, D.I.; Barth, J.L.; Reed, R.A.; LaBel, K.A.; Howard, J.W.; van Tyne, K.M.
卷第46卷
期第6期
印刷ISSN0018-9499
文件大小886.52KB
发表时间1999
DOI10.1109/23.819133
页码1640-1651

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