SPIE Proceedings [SPIE Optoelectronics '99 - Integrated Optoelectronic Devices - San Jose, CA (Saturday 23 January 1999)] Testing, Packaging, Reliability, and Applications of Semiconductor Lasers IV - Characteristics and reliability of high-power InGaAs/AlGaAs laser diodes with decoupled confinement heterostructure
- 作者Yamada, Yoshikazu; Okubo, Atsushi; Oeda, Yasuo; Yamada, Yumi; Fujimoto, Tsuyoshi; Muro, Kiyofumi; Fallahi, Mahmoud; Linden, Kurt J.; Wang, S. C.
- 卷第3626卷
- 印刷ISSN0277-786X
- 文件大小1240.39KB
- 发表时间1999
- DOI10.1117/12.345434
- 页码231-239