[IEEE 1999 IEEE Africon. 5th Africon Conference in Africa - Cape Town, South Africa (28 Sept.-1 Oct. 1999)] 1999 IEEE Africon. 5th Africon Conference in Africa (Cat. No.99CH36342) - Electrocontact microdisplacement testing subsystem
Zagursky, V.; Zibinch, D.
- 作者Zagursky, V.; Zibinch, D.
- 卷第1卷
- 文件大小259.70KB
- 发表时间1999
- DOI10.1109/AFRCON.1999.820943
- 页码521-524