Neighborhood Planning
- 期刊名称Journal of Planning Education and Research
- 作者Keating, W. D.; Krumholz, N.
- 卷第20卷
- 期第1期
- 印刷ISSN0739-456X
- 文件大小75.57KB
- 发表时间2000-09-01
- DOI10.1177/073945600128992546
- 页码111-114
[IEEE International Electron Devices Meeting 1999. Technical Digest - Washington, DC, USA (5-8 Dec. 1999)] International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) - Magnetoelectronic devicesDe Boeck, J.; Borghs, G. · 1999
[IEEE International Electron Devices Meeting 1999. Technical Digest - Washington, DC, USA (5-8 Dec. 1999)] International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) - Issues in modeling small devicesLaux, S.E.; Fischetti, M.V. · 1999
[IEEE International Electron Devices Meeting 1999. Technical Digest - Washington, DC, USA (5-8 Dec. 1999)] International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) - Single electron and few electron memory cellsAhmed, H. · 1999
[IEEE International Electron Devices Meeting 1999. Technical Digest - Washington, DC, USA (5-8 Dec. 1999)] International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) - Toward scientific manufacturingTsujide, T. · 1999
[IEEE International Electron Devices Meeting 1999. Technical Digest - Washington, DC, USA (5-8 Dec. 1999)] International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) - Consumer electronics as silicon engineKramer, R. · 1999
[IEEE International Electron Devices Meeting 1999. Technical Digest - Washington, DC, USA (5-8 Dec. 1999)] International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) - Si complementary single-electron inverterOno, Y.; Takahashi, Y.; Yamazaki, K.; Nagase, M.; Namatsu, H.; Kurihara, K.; Murase, K. · 1999
[IEEE International Electron Devices Meeting 1999. Technical Digest - Washington, DC, USA (5-8 Dec. 1999)] International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) - Current and future development of high power MOS devicesOhashi, H. · 1999
[IEEE International Electron Devices Meeting 1999. Technical Digest - Washington, DC, USA (5-8 Dec. 1999)] International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) - A comprehensive MOSFET mismatch modelDrennan, P.G.; McAndrew, C.C. · 1999