[Univ. Tehran ICM 2000. Proceedings of the 12th International Conference on Microelectronics - Tehran, Iran (31 Oct.-2 Nov. 2000)] ICM 2000. Proceedings of the 12th International Conference on Microelectronics. (IEEE Cat. No.00EX453) - Compensation in MBE-grown GaAs doped with silicon and beryllium
- 作者Mohades-Kassai, A.
- 文件大小299.25KB
- 发表时间2000
- DOI10.1109/icm.2000.916473
- 页码341-344
Development of modular productsKusiak, A.; Chun-Che Huang, · IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A · 1996
Dynamic manufacturing process controlPearsall, K.; Raines, B. · IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A · 1994
Electronic Components ObsolescenceCondra, L.W.; Anissipour, A.A.; Mayfield, D.D.; Pecht, M.G. · IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A · 1997
Nonvolatile MemoryBrewer, J.E. · IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A · 1997
Semiconductor workbench for integrated modelingWeckman, J. · IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A · 1994
The benefits of stress testingChan, H.A. · IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A · 1995
Metal diffusion in polymersDas, J.H.; Morris, J.E. · IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part B · 1994
Multiconductor transmission line characterizationWilliams, D.F. · IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part B · 1997