![[IEEE 2010 IEEE 3rd International Nanoelectronics Conference (INEC) - Hong Kong, China (2010.01.3-2010.01.8)] 2010 3rd International Nanoelectronics Conference (INEC) - Microstructure and thermal properties of phase change (GeSbSn)<inf>100-x</inf>Co<inf>x</inf> optical recording films]()
[IEEE 2010 IEEE 3rd International Nanoelectronics Conference (INEC) - Hong Kong, China (2010.01.3-2010.01.8)] 2010 3rd International Nanoelectronics Conference (INEC) - Microstructure and thermal properties of phase change (GeSbSn)<inf>100-x</inf>Co<inf>x</inf> optical recording filmsSin-Liang Ou, ; Po-Cheng Kuo, ; Shih-Hsien Ma, ; Chih-Long Shen, ; Wei-Tai Tang, ; Don-Yau Chiang, ; Chao-Te Lee, · 2010