Advantages of stereo imaging of metallic surfaces with low voltage backscattered electrons in a field emission scanning electron microscope
- 作者R. G. Richards; M. Wieland; M. Textor
- 卷第199卷
- 期第2期
- 印刷ISSN0022-2720
- 电子ISSN1365-2818
- 文件大小667.42KB
- 发表时间2000
- DOI10.1046/j.1365-2818.2000.00717.x
- 页码115-123
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