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Bias-dependence of FET intrinsic noise sources, determined with a quasi-2D modelA. Lázaro; M. C. Maya; L. Pradell · 2003
Extraction of an avalanche diode noise model for its application as an on-wafer noise sourceM. C. Maya; A. Lázaro; L. Pradell · 2003
A method for the determination of a distributed FET noise model based on matched-source noise-figure measurementsM. C. Maya; A. Lázaro; L. Pradell · 2004
A method for characterizing coplanar waveguide-to-microstrip transitions, and its application to the measurement of microstrip devices with coplanar microprobesM. C. Maya; A. Lázaro; P. DePaco; L. Pradell · 2003