![Expanding the Depth of Field for Imaging with Low keV Electrons: High Resolution Surface Observations of Nanostructured LaB6 Using Low keV Secondary and Backscattered Electrons]()
Expanding the Depth of Field for Imaging with Low keV Electrons: High Resolution Surface Observations of Nanostructured LaB6 Using Low keV Secondary and Backscattered ElectronsSunaoshi, Takeshi; Okada, Satoshi; Kaji, Kazutoshi; Voelkl, Edgar; Ramachandran, Roshini; Salguero, Tina · Microscopy and Microanalysis · 2017