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[IEEE 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual - Orlando, FL, USA (30 April-3 May 2001)] 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) - Analysis of erratic bits in flash memories

[IEEE 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual - Orlando, FL, USA (30 April-3 May 2001)] 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) - Analysis of erratic bits in flash memories

Chimenton, A.; Pellati, P.; Olivo, P.
  • 作者Chimenton, A.; Pellati, P.; Olivo, P.
  • 文件大小554.14KB
  • 发表时间2001
  • DOI10.1109/relphy.2001.922875
  • 页码17-22
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