[IEEE 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual - Orlando, FL, USA (30 April-3 May 2001)] 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) - Analysis of erratic bits in flash memories
Chimenton, A.; Pellati, P.; Olivo, P.
- 作者Chimenton, A.; Pellati, P.; Olivo, P.
- 文件大小554.14KB
- 发表时间2001
- DOI10.1109/relphy.2001.922875
- 页码17-22