![[IEEE 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Newark, CA, USA (2019.4.4-2019.4.9)] 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Test-Driven Anonymization for Artificial Intelligence]()
[IEEE 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Newark, CA, USA (2019.4.4-2019.4.9)] 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Test-Driven Anonymization for Artificial IntelligenceAugusto, Cristian; Moran, Jesus; De La Riva, Claudio; Tuya, Javier · 2019