Medical admission racket busted in India
- 作者Dinesh C Sharma
- 卷第359卷
- 期第9302期
- 印刷ISSN0140-6736
- 电子ISSN1474-547X
- 文件大小44.68KB
- 发表时间2002
- DOI10.1016/s0140-6736(02)07487-1
[IEEE International Electron Devices Meeting 1998. Technical Digest - San Francisco, CA, USA (1998.12.6-1998.12.9)] International Electron Devices Meeting 1998 Technical Digest (Cat No 98CH36217) IEDM-98 - International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217)1998
[IEEE International Electron Devices Meeting 1998. Technical Digest - San Francisco, CA, USA (1998.12.6-1998.12.9)] International Electron Devices Meeting 1998 Technical Digest (Cat No 98CH36217) IEDM-98 - Author index1998
[IEEE International Electron Devices Meeting 1998. Technical Digest - San Francisco, CA, USA (6-9 Dec. 1998)] International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) - Lateral thinking about power devices (LDMOS)Efland, T.R.; Chin-Yu Tsai, ; Pendharkar, S. · 1998
[IEEE International Electron Devices Meeting 1998. Technical Digest - San Francisco, CA, USA (6-9 Dec. 1998)] International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) - Wide bandgap semiconductor power electronicsWeitzel, C.E. · 1998
[IEEE International Electron Devices Meeting 1998. Technical Digest - San Francisco, CA, USA (6-9 Dec. 1998)] International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) - Within-chip variability analysisNassif, S.R. · 1998
[IEEE International Electron Devices Meeting 1998. Technical Digest - San Francisco, CA, USA (6-9 Dec. 1998)] International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) - Intercontinental migration of dominant technologiesOtala, M. · 1998
[IEEE International Electron Devices Meeting 1998. Technical Digest - San Francisco, CA, USA (6-9 Dec. 1998)] International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) - Status of single-electron memoriesYano, K.; Ishii, T.; Sano, T.; Mine, T.; Murai, F.; Kure, T.; Seki, K. · 1998
[IEEE International Electron Devices Meeting 1998. Technical Digest - San Francisco, CA, USA (6-9 Dec. 1998)] International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) - Flexible hot-electron programming of flash memoriesEsseni, D.; Ricco, B. · 1998