![[IEEE IEEE MTT-S International Microwave Symposium Digest, 2005. - Long Beach, CA, USA (12-17 June 2005)] IEEE MTT-S International Microwave Symposium Digest, 2005. - On the Definition and the Derivation of the Characteristic Parameters of Coupled Lines, and Application to MoM Analysis]()
[IEEE IEEE MTT-S International Microwave Symposium Digest, 2005. - Long Beach, CA, USA (12-17 June 2005)] IEEE MTT-S International Microwave Symposium Digest, 2005. - On the Definition and the Derivation of the Characteristic Parameters of Coupled Lines, and Application to MoM AnalysisFarina, M.; Morini, A.; Rozzi, T. · 2005