[IEEE Vehicular Technology Conference. IEEE 55th Vehicular Technology Conference. VTC Spring 2002 - Birmingham, AL, USA (6-9 May 2002)] Vehicular Technology Conference. IEEE 55th Vehicular Technology Conference. VTC Spring 2002 (Cat. No.02CH37367) - A comparative study of transmit diversity schemes for 3G-CDMA system with correlation and power discrimination between diversity branches
- 作者Yongzhe Xie, ; Raghothaman, B.
- 卷第1卷
- 文件大小389.24KB
- 发表时间2002
- DOI10.1109/vtc.2002.1002701
- 页码245-249
Fault diagnosis in loop-connected systemsKewal K. Saluja; Brian D.O. Anderson · 1980
Testable design of large random access memoriesKewal K. Saluja; Kim Thang Le · 1984
On-chip testing of random access memoriesKewal K. Saluja · 1994
Sequential test generators: past, present and futureYong Chang Kim; Kewal K. Saluja · 1998
Incorporating testability considerations in high-level synthesisAshutosh Mujumdar; Rajiv Jain; Kewal Saluja · 1994
Vulnerability of Surveillance Networks to FaultsChin, Tai-Lin; Clouqueur, Thomas; Ramanathan, Parameswaran; Saluja, Kewal K. · International Journal of Distributed Sensor Networks · 2006
HYSIM: Hybrid Fault Simulation for Synchronous Sequential CircuitsKim, Kyuchull; Saluja, Kewal K. · VLSI Design · 1996
A Heuristic Measure to Maximize Detected Faults per TestKim T. Le; Kewal K. Saluja · 1998