Box on Quality and Discovery with Design, Control, and Robustnessby George C. Tiao; Søren Bisgaard; William J. Hill; Daniel Peña; Stephen M. Stigler
- 期刊名称Technometrics
- 作者Review by: Julia O'Neill
- 卷第45卷
- 期第1期
- 印刷ISSN0040-1706
- 文件大小325.64KB
- 发表时间2003-02
- DOI10.2307/25046986
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Self Modeling Curve ResolutionWilliam H. Lawton and Edward A. Sylvestre · Technometrics · 1971
Estimation from Accelerated Life TestsRichard E. Barlow and Ernest M. Scheuer · Technometrics · 1971
Model Robust, Linear-Optimal DesignsR. Dennis Cook and Christopher J. Nachtsheim · Technometrics · 1982
Developments in Linear Regression Methodology: 1959-1982R. R. Hocking · Technometrics · 1983
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Computer Aided Design of ExperimentsR. W. Kennard and L. A. Stone · Technometrics · 1969