Institutional mergers in higher education: Lessons from international experience
- 期刊名称Tertiary Education and Management
- 作者Harman, Grant; Harman, Kay
- 卷第9卷
- 期第1期
- 印刷ISSN1358-3883
- 电子ISSN1573-1936
- 文件大小1010.82KB
- 发表时间2003-01
- DOI10.1080/13583883.2003.9967091
- 页码29-44
[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - 2006 IEEE International Reliability Physics Symposium Proceedings2006
[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - 2006 IEEE International Reliability Physics Symposium Proceedings 44th Annual2006
[IEEE 2006 IEEE International Reliability Physics Symposium proceedings. 44th Annual - San Jose, CA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - 2007 International Reliability Physics Symposium2006
[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - 2007 IEEE International Reliability Physics Symposium; Call for Papers and Call for Posters2006
[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - Reliability in MEMS PackagingHsu, Tai-ran · 2006
[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - Preface2006
[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - Biographies2006
[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - Anovel High Reliability ILD StackNaughton, John; Nelson, Mark · 2006