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The Effect of Gate Metal Interdiffusion on Reliability Performance in GaAs PHEMTs

The Effect of Gate Metal Interdiffusion on Reliability Performance in GaAs PHEMTs

Y. Chou; D. Leung; R. Grundbacher; R. Lai; P. Liu; Q. Kan; M. Biedenbender; D. Eng; A. Oki
  • 作者Y. Chou; D. Leung; R. Grundbacher; R. Lai; P. Liu; Q. Kan; M. Biedenbender; D. Eng; A. Oki
  • 卷第25卷
  • 期第6期
  • 文件大小143.52KB
  • 发表时间2004
  • DOI10.1109/LED.2004.828989
  • 页码351-353
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