Erratum
- 期刊名称GIScience & Remote Sensing
- 卷第41卷
- 期第2期
- 印刷ISSN1548-1603
- 文件大小223.73KB
- 发表时间2004-6-1
- DOI10.2747/1548-1603.41.2.185
- 页码185-185
Double channel field effect transistors (DCT) and demonstration of static single transistor bit cellFrank Wirbeleit · 2010
Optical Detection of SiN Stress Layer Induced Carrier Mobility Enhancement in SiliconWirbeleit, Frank; Pedrero, Victoria; Thron, Dominik; Stephan, Rolf; Schwalke, Udo · MRS Proceedings · 2008
Non-Gaussian Diffusion of Phosphorus and Arsenic in Silicon with Local Density Diffusivity ModelWirbeleit, Frank · Defect and Diffusion Forum · 2010
USJ Dopant Bleaching and Device Effects in Advanced Microelectronic Plasma Enhanced Resist Strip ProcessingWirbeleit, Frank; Grimm, Volker; Krüger, Christian; Streck, Christoph; Sonnemans, Roger; Berry, Ivan · MRS Proceedings · 2008
Stacked field effect transistor integration in double channel transistors (DCT) with tri-state transfer slope and ballistic field effect behaviorFrank Wirbeleit · 2010
Local Density Diffusivity (LDD-) Model for Boron Out-Diffusion of <i>In Situ</i> Boron-Doped Si<sub>0.75</sub>Ge<sub>0.25</sub> Epitaxial Films Post Advanced Rapid Thermal Anneals with Carbon Co-ImplantWirbeleit, Frank · Defect and Diffusion Forum · 2010
Oxidation of High Technology MaterialsPhilibert, Jean · Defect and Diffusion Forum · 1988
Diffusion in Solids under PressureMehrer, Helmut · Defect and Diffusion Forum · 2011
Thermodynamic Diffusion CoefficientsKale, G.B. · Defect and Diffusion Forum · 2008
SemiconductorsDefect and Diffusion Forum · 1989
Reactive Diffusion and StressesGusak, Andriy; Lyashenko, Yu.A.; Bogatyrev, A.O. · Defect and Diffusion Forum · 1996
Diffusion and StressesPhilibert, Jean · Defect and Diffusion Forum · 1996
Adolf Fick and Diffusion EquationsPhilibert, Jean · Defect and Diffusion Forum · 2006
Diffusion and MeltingTiwari, G.P.; Mehrotra, R.S. · Defect and Diffusion Forum · 2008