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[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - STIL persistence

[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - STIL persistence

Maston, G.; Villar, J.
  • 作者Maston, G.; Villar, J.
  • 文件大小160.88KB
  • 发表时间2005
  • DOI10.1109/test.2005.1584074
  • 页码1076-1081
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