[IEEE 11th IEEE International Software Metrics Symposium (METRICS'05) - Como, Italy (19-22 Sept. 2005)] 11th IEEE International Software Metrics Symposium (METRICS'05) - Dynamic Code Coverage Metrics: A Lognormal Perspective
- 作者Gokhale, S.S.; Mullen, R.E.
- 文件大小168.91KB
- 发表时间2005
- DOI10.1109/metrics.2005.17
- 页码33-33
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