A traceable quantification procedure for a multi-mode X-ray photoelectron spectrometer
- 作者John Walton; Neal Fairley
- 卷第150卷
- 期第1期
- 印刷ISSN0368-2048
- 文件大小405.32KB
- 发表时间2006
- DOI10.1016/j.elspec.2005.08.001
- 页码15-20
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