![SPIE Proceedings [SPIE 32nd Annual Technical Symposium - San Diego, CA (Monday 15 August 1988)] Stray Light and Contamination in Optical Systems - <title>Performance Of A Fully Automated Scatterometer For BRDF And BTDF Measurements At Visible And Infrared Wavelengths</title>]()
SPIE Proceedings [SPIE 32nd Annual Technical Symposium - San Diego, CA (Monday 15 August 1988)] Stray Light and Contamination in Optical Systems - <title>Performance Of A Fully Automated Scatterometer For BRDF And BTDF Measurements At Visible And Infrared Wavelengths</title>Anderson, Scot; Pompea, Stephen M.; Shepard, Donald F.; Castonauay, Raymond; Breault, Robert P. · 1989