[IEEE IEEE 1988 Custom Integrated Circuits Conference - Rochester, NY, USA (16-19 May 1988)] Proceedings of the IEEE 1988 Custom Integrated Circuits Conference - Measurements of switched capacitor filters generated with a silicon compilerHelms, W.J. · 1988

[IEEE International Symposium on VLSI Technology Systems and Applications - Taipei, Taiwan (8-10 June 1999)] 1999 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers. (Cat. No.99TH8453) - A case for a multitrace clusterYiu Cheong Wu, ; Ling, J.; Helms, W.J. · 1999

[IEEE Comput. Soc Ninth Great Lakes Symposium on VLSI - Ypsilanti, MI, USA (4-6 March 1999)] Proceedings Ninth Great Lakes Symposium on VLSI - A bandpass sigma-delta for software low-power and low-voltage radio by using PATH techniqueYiu Wu, ; Ling, J.; Helms, W.J. · 1999

Graphene Frequency MultipliersHan Wang, ; Nezich, D.; Jing Kong, ; Palacios, T. · IEEE Electron Device Letters · 2009

Impact ionization in GaAs MESFETsHui, K.; Hu, C.; George, P.; Ko, P.K. · IEEE Electron Device Letters · 1990

Stability Analysis in CNTFETsHaji-Nasiri, Saeed; Moravvej-Farshi, Mohammad Kazem · IEEE Electron Device Letters · 2013

A Memristor Device ModelYakopcic, Chris; Taha, Tarek M.; Subramanyam, Guru; Pino, Robinson E.; Rogers, Stanley · IEEE Electron Device Letters · 2011

Junctionless Tunnel Field Effect TransistorGhosh, Bahniman; Akram, Mohammad Waseem · IEEE Electron Device Letters · 2013

Strained SOI FINFET SRAM DesignKerber, Pranita; Kanj, Rouwaida; Joshi, Rajiv V. · IEEE Electron Device Letters · 2013

Electromigration characteristics of copper interconnectsTao, J.; Cheung, N.W.; Hu, C. · IEEE Electron Device Letters · 1993

MOSFET drain breakdown voltageWu-Shiung Feng, ; Chan, T.Y.; Chenming Hu · IEEE Electron Device Letters · 1986