Recent progress in thin film growth analysis by multichannel spectroscopic ellipsometryR.W Collins; Joohyun Koh; H Fujiwara; P.I Rovira; A.S Ferlauto; J.A Zapien; C.R Wronski; R Messier · 2000

Efficient thin-film stack characterization using parametric sensitivity analysis for spectroscopic ellipsometry in semiconductor device fabricationLikhachev, D.V. · Thin Solid Films · 2015

Envelope analysis in spectroscopic ellipsometry of thin films. Application to a weakly-absorbing polymer filmJ.C. Martinez-Antón; J.A. Gómez-Pedrero; A. Álvarez-Herrero · 2004

Real time spectroscopic ellipsometry for analysis and control of thin film polycrystalline semiconductor deposition in photovoltaicsKoirala, Prakash; Attygalle, Dinesh; Aryal, Puruswottam; Pradhan, Puja; Chen, Jie; Marsillac, Sylvain; Ferlauto, Andre S.; Podraza, Nikolas J.; Collins, Robert W. · Thin Solid Films · 2014

7–10 June, 1983 International conference on ellipsometry and other optical methods for surface and thin film analysis to be held in Paris, France1982

Through-the-glass spectroscopic ellipsometry for analysis of CdTe thin-film solar cells in the superstrate configurationKoirala, Prakash; Li, Jian; Yoon, Heayoung P.; Aryal, Puruswottam; Marsillac, Sylvain; Rockett, Angus A.; Podraza, Nikolas J.; Collins, Robert W. · Progress in Photovoltaics: Research and Applications · 2016

Spectroscopic ellipsometry analysis for investigation of the modification of thin film p-a-Si1−xCx:H after ultraviolet treatment in an Argon ambientSeung Yeop Myong; Sang Soo Kim; Koeng Su Lim · 2004