The data acquisition and calibration system for the ATLAS Semiconductor Tracker

• 期刊名称Journal of Instrumentation
• 作者Abdesselam, A; Barber, T; Barr, A J; Bell, P; Bernabeu, J; Butterworth, J M; Carter, J R; Carter, A A; Charles, E; Clark, A; Colijn, A -P; Costa, M J; Dalmau, J M; Demirköz, B; Dervan, P J; Donega, M; D'Onifrio, M; Escobar, C; Fasching, D; Ferguson, D P S; Ferrari, P; Ferrere, D; Fuster, J; Gallop, B; García, C; Gonzalez, S; Gonzalez-Sevilla, S; Goodrick, M J; Gorisek, A; Greenall, A; Grillo, A A; Hessey, N P; Hill, J C; Jackson, J N; Jared, R C; Johannson, P D C; Jong, P de; Joseph, J; Lacasta, C; Lane, J B; Lester, C G; Limper, M; Lindsay, S W; McKay, R L; Magrath, C A; Mangin-Brinet, M; García, S Martí I; Mellado, B; Meyer, W T; Mikulec, B; Miñano, M; Mitsou, V A; Moorhead, G; Morrissey, M; Paganis, E; Palmer, M J; Parker, M A; Pernegger, H; Phillips, A; Phillips, P W; Postranecky, M; Robichaud-Véronneau, A; Robinson, D; Roe, S; Sandaker, H; Sciacca, F; Sfyrla, A; Stanecka, E; Stapnes, S; Stradling, A; Tyndel, M; Tricoli, A; Vickey, T; Vossebeld, J H; Warren, M R M; Weidberg, A R; Wells, P S; Wu, S L
• 卷第3卷
• 期第1期
• 电子ISSN1748-0221
• 文件大小1360.08KB
• 发表时间2008-01-28
• DOI10.1088/1748-0221/3/01/P01003