Book reviews
- 期刊名称Safundi
- 作者Marx, Lesley; Zimbler, Jarad; Coetzee, Carli; Murray, Jessica; Muvangua, Nyoko
- 卷第10卷
- 期第3期
- 印刷ISSN1753-3171
- 电子ISSN1543-1304
- 文件大小130.31KB
- 发表时间2009-07
- DOI10.1080/17533170903021039
- 页码359-375
Delay fault models for VLSI circuitsIrith Pomeranz; Sudhakar M Reddy · 1998
FaultHoundNitin, ; Pomeranz, Irith; Vijaykumar, T. N. · ACM SIGARCH Computer Architecture News · 2015
Extended Transparent-ScanPomeranz, Irith · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2019
On multi-cycle test cubesPomeranz, Irith · IET Computers & Digital Techniques · 2013
On Selecting Testable Paths in Scan DesignsYun Shao; Sudhakar M. Reddy; Irith Pomeranz; Seiji Kajihara · 2003
Reverse Low-Power Broadside TestsPomeranz, Irith · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2019
New Targets for Diagnostic Test GenerationPomeranz, Irith · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2019
Functional Broadside Tests under Broadcast ScanPomeranz, Irith · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2019