![[IEEE 2008 IEEE Second International Conference on Biometrics: Theory, Applications and Systems - Washington, DC, USA (2008.09.29-2008.10.1)] 2008 IEEE Second International Conference on Biometrics: Theory, Applications and Systems - The Iris Challenge Evaluation 2005]()
[IEEE 2008 IEEE Second International Conference on Biometrics: Theory, Applications and Systems - Washington, DC, USA (2008.09.29-2008.10.1)] 2008 IEEE Second International Conference on Biometrics: Theory, Applications and Systems - The Iris Challenge Evaluation 2005Phillips, P. Jonathon; Bowyer, Kevin W.; Flynn, Patrick J.; Liu, Xiaomei; Scruggs, W. Todd · 2008