Extreme temperature 6H-SiC JFET integrated circuit technology
- 作者Philip G. Neudeck; Steven L. Garverick; David J. Spry; Liang-Yu Chen; Glenn M. Beheim; Michael J. Krasowski; Mehran Mehregany
- 卷第206卷
- 期第10期
- 印刷ISSN1862-6319
- 文件大小1355.34KB
- 发表时间2009
- DOI10.1002/pssa.200925188
- 页码2329-2345
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